Introduction to Scanning Tunneling Microscopy - Chen, C. Julian (Department of Applied Physics and Applied Mathematics, Columbia University, New York)
Chen, C. Julian (Department of Applied Physics and Applied Mathematics, Columbia University, New York) |
2016 |
Zachte kaft |
Engels
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€ 84,95
Beschrijving
The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. The 1st edition has nurtured numerous beginners and experts since 1993. The 2nd edition is a thoroughly updated version of this 'bible' in the field.
Specificaties
Door (auteur) | Chen, C. Julian (Department of Applied Physics and Applied Mathematics, Columbia University, New York) |
Uitgeverij | Van Ditmar Boekenimport B.V. |
Genre | Exacte wetenschappen/natuurwetenschappen algemeen |
Uitgave | Zachte kaft |
Aantal pagina's | 488 |
Verschenen op | 01-01-2016 |
ISBN / EAN | 9780198754756 |
Taal | Engels |
Gewicht | 726 g |
Hoogte | 229 mm |
Breedte | 159 mm |
Dikte | 25 mm |