Introduction to Scanning Tunneling Microscopy - Chen, C. Julian (Department of Applied Physics and Applied Mathematics, Columbia University, New York)

Chen, C. Julian (Department of Applied Physics and Applied Mathematics, Columbia University, New York) | 2016 | Zachte kaft | Engels
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Beschrijving

The scanning tunneling and the atomic force microscope, both capable of imaging individual atoms, were crowned with the Physics Nobel Prize in 1986, and are the cornerstones of nanotechnology today. The 1st edition has nurtured numerous beginners and experts since 1993. The 2nd edition is a thoroughly updated version of this 'bible' in the field.

Specificaties

Door (auteur) Chen, C. Julian (Department of Applied Physics and Applied Mathematics, Columbia University, New York)
Uitgeverij Van Ditmar Boekenimport B.V.
Genre Exacte wetenschappen/natuurwetenschappen algemeen
Uitgave Zachte kaft
Aantal pagina's 488
Verschenen op 01-01-2016
ISBN / EAN 9780198754756
Taal Engels
Gewicht 726 g
Hoogte 229 mm
Breedte 159 mm
Dikte 25 mm