New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices - Zalevsky, Zeev (Faculty of Engineering and the Center for Advanced Materials and Nanotechnology, Bar-Ilan University), Livshits, Pavel (Researcher at Bar-Ilan University, Faculty of Engineering, Israel), Gur, Eran (Dept. of Electronics Engineering, Jerusalem College of Engineering, Jerusalem, 91035, Israel)
Zalevsky, Zeev (Faculty of Engineering and the Center for Advanced Materials and Nanotechnology, Bar-Ilan University), Livshits, Pavel (Researcher at Bar-Ilan University, Faculty of Engineering, Israel), Gur, Eran (Dept. of Electronics Engineering, Jerusalem College of Engineering, Jerusalem, 91035, Israel) |
2013 |
Zachte kaft |
Engels
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€ 49,95
Beschrijving
Introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. This book presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization.
Specificaties
| Door (auteur) | Zalevsky, Zeev (Faculty of Engineering and the Center for Advanced Materials and Nanotechnology, Bar-Ilan University), Livshits, Pavel (Researcher at Bar-Ilan University, Faculty of Engineering, Israel), Gur, Eran (Dept. of Electronics Engineering, Jerusalem College of Engineering, Jerusalem, 91035, Israel) |
| Uitgeverij | Van Ditmar Boekenimport B.V. |
| Genre | Technische wetenschappen algemeen |
| Uitgave | Zachte kaft |
| Aantal pagina's | 110 |
| Verschenen op | 01-01-2013 |
| ISBN / EAN | 9780323241434 |
| Taal | Engels |
